To kickoff the “Emission Solutions in Transportation”
Conference, Oct 16-18, 2007, that the American Filtration and Separations
Society (AFS) is holding in
The “Basics and Applications of Particle Characterization”
course attendees will learn to improve characterization and data interpretation
skills for better particle separation, control of particulates, particulate
formulation, suspensions, and dispersions.
This course will be of interest to scientists and engineers
who want to improve their characterization and data interpretation skills for
better particle separation, control of particulates, particulate formulation,
suspensions, and dispersions. Given the
wide range of technologies available for particle size and shape
characterization, selection of the best technology for a particular application
is not a trivial task. This short course
will cover the basics of particle size (from nanoscale to millimeters)
characterization along with several commercially available technologies. Participants will acquire the knowledge
necessary for proper instrument selection and data validation and
interpretation.
The following topics will be covered:
Basic concepts
Data representation
Number, Surface Area, Volume Distributions
Averages
Sampling
Technologies
& Data Interpretation
Laser diffraction
Sedimentation
Image Analysis
Dynamic Light Scattering
Optical Particle Counting
Electrozone Particle Counters
Ultrasonic Spectroscopy
Hydrodynamic Chromatography
For information on the Basics & Applications of Particle
Characterizations Training and instructor biographies go to:
http://afssociety.org/pr1/particlecharacterizations.htm
http://afssociety.org/pr1/emissions.html
http://afssociety.org/pr1/
Suzanne Sower
American Filtration and Separations Society
Phone: 612-861-1277
Fax: 612-861-7959